Pages that link to "Item:Q2306784"
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The following pages link to Bayesian accelerated life test plans for series systems with Weibull component lifetimes (Q2306784):
Displaying 7 items.
- Optimal truncated repetitive lot inspection with defect rates (Q1985091) (← links)
- Change-point detection of failure mechanism for electronic devices based on Arrhenius model (Q2182931) (← links)
- Balancing producer and consumer risks in optimal attribute testing: a unified Bayesian/frequentist design (Q2184150) (← links)
- Optimal lot sentencing based on defective counts and prior acceptability (Q2223885) (← links)
- Statistical inference for the reliability of Burr-XII distribution under improved adaptive type-II progressive censoring (Q2242457) (← links)
- Optimal lot disposition from Poisson-Lindley count data (Q2310620) (← links)
- Implementation of compound optimal design strategy in censored life-testing experiment (Q2665789) (← links)
