Change-point detection of failure mechanism for electronic devices based on Arrhenius model (Q2182931)

From MaRDI portal
scientific article
Language Label Description Also known as
English
Change-point detection of failure mechanism for electronic devices based on Arrhenius model
scientific article

    Statements

    Change-point detection of failure mechanism for electronic devices based on Arrhenius model (English)
    0 references
    26 May 2020
    0 references
    0 references
    accelerated life testing
    0 references
    Arrhenius model
    0 references
    change-point analysis
    0 references
    failure mechanism
    0 references
    information criterion
    0 references
    Weibull distribution
    0 references
    0 references
    0 references
    0 references
    0 references