Change-point detection of failure mechanism for electronic devices based on Arrhenius model (Q2182931)
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scientific article; zbMATH DE number 7203936
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| English | Change-point detection of failure mechanism for electronic devices based on Arrhenius model |
scientific article; zbMATH DE number 7203936 |
Statements
Change-point detection of failure mechanism for electronic devices based on Arrhenius model (English)
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26 May 2020
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accelerated life testing
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Arrhenius model
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change-point analysis
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failure mechanism
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information criterion
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Weibull distribution
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0.7316898107528687
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0.7242772579193115
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