Change-point detection of failure mechanism for electronic devices based on Arrhenius model
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Publication:2182931
DOI10.1016/j.apm.2020.02.011zbMath1481.62116OpenAlexW3008848779MaRDI QIDQ2182931
Jia-Lu Li, Yu-Bin Tian, Dian-Peng Wang
Publication date: 26 May 2020
Published in: Applied Mathematical Modelling (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.apm.2020.02.011
accelerated life testingWeibull distributioninformation criterionchange-point analysisfailure mechanismArrhenius model
Applications of statistics in engineering and industry; control charts (62P30) Testing in survival analysis and censored data (62N03)
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Uses Software
Cites Work
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