Change-point detection of failure mechanism for electronic devices based on Arrhenius model

DOI10.1016/j.apm.2020.02.011zbMath1481.62116OpenAlexW3008848779MaRDI QIDQ2182931

Jia-Lu Li, Yu-Bin Tian, Dian-Peng Wang

Publication date: 26 May 2020

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2020.02.011

zbMATH Keywords

accelerated life testingWeibull distributioninformation criterionchange-point analysisfailure mechanismArrhenius model

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Testing in survival analysis and censored data (62N03)

Related Items (3)

A novel method to generating two-sided class of probability distributions ⋮ A semi-quantum approach for modelling the accelerated test data ⋮ Fiducial inference-based failure mechanism consistency analysis for accelerated life and degradation tests

Uses Software

• SPLIDA

Cites Work

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• Estimating the parameters of Weibull distribution and the acceleration factor from hybrid partially accelerated life test
• Bayesian accelerated life testing under competing log-location-scale family of causes of failure
• A generalized modified Weibull distribution for lifetime modeling
• Estimating the dimension of a model
• Bayesian accelerated life test plans for series systems with Weibull component lifetimes
• Accelerated Life Models
• Detection of a “Disorder” in a Wiener Process
• Accelerated Testing
• Change-point analysis with bathtub shape for the exponential distribution

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