Change-point detection of failure mechanism for electronic devices based on Arrhenius model

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Publication:2182931

DOI10.1016/j.apm.2020.02.011zbMath1481.62116OpenAlexW3008848779MaRDI QIDQ2182931

Jia-Lu Li, Yu-Bin Tian, Dian-Peng Wang

Publication date: 26 May 2020

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2020.02.011




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