A semi-quantum approach for modelling the accelerated test data
DOI10.1016/J.APM.2021.11.020zbMATH Open1505.62510OpenAlexW3214896198MaRDI QIDQ2109814FDOQ2109814
Authors: Kunsong Lin, Jiaxiao Zhu, Yunxia Chen 
Publication date: 21 December 2022
Published in: Applied Mathematical Modelling (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.apm.2021.11.020
lifetime uncertaintyaccelerated life testaccelerated failure-time modelproportional decay modelsemi-quantum approach
Reliability and life testing (62N05) Open systems, reduced dynamics, master equations, decoherence (81S22)
Cites Work
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- A non-Hermitian quantum approach to reliability of a two-state system
- Nonlinear mixed reliability model with non-constant shape parameter of aviation cables
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