A semi-quantum approach for modelling the accelerated test data

DOI10.1016/J.APM.2021.11.020MaRDI QIDQ2109814zbMATH OpenOpenAlexFDO

Authors Kunsong Lin, Jiaxiao Zhu, Yunxia Chen

Publication date 21 December 2022

Published in Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.apm.2021.11.020

zbMATH Keywords

accelerated failure-time modelaccelerated life testlifetime uncertaintyproportional decay modelsemi-quantum approach

Mathematics Subject Classification ID

Reliability and life testing (62N05) Open systems, reduced dynamics, master equations, decoherence (81S22)

Cites work

• A generalized model for static fatigue lifetime evaluation of optical fibers to reduce the model uncertainty
• A non-Hermitian quantum approach to reliability of a two-state system
• Change-point detection of failure mechanism for electronic devices based on Arrhenius model
• Design of accelerated life test sampling plans with a nonconstant shape parameter
• scientific article; zbMATH DE number 1866308 (Why is no real title available?)
• Inference of constant-stress accelerated life test for a truncated distribution under progressive censoring
• Nonlinear mixed reliability model with non-constant shape parameter of aviation cables

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