Pages that link to "Item:Q2182931"
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The following pages link to Change-point detection of failure mechanism for electronic devices based on Arrhenius model (Q2182931):
Displaying 4 items.
- A semi-quantum approach for modelling the accelerated test data (Q2109814) (← links)
- Fiducial inference-based failure mechanism consistency analysis for accelerated life and degradation tests (Q2109894) (← links)
- A novel method to generating two-sided class of probability distributions (Q2242467) (← links)
- Inference and expected total test time for step-stress life test in the presence of complementary risks and incomplete data (Q6567437) (← links)
