Pages that link to "Item:Q3401367"
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The following pages link to The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing (Q3401367):
Displaying 8 items.
- On the choice of the optimal tuning parameter in robust one-shot device testing analysis (Q2087079) (← links)
- Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data (Q2338101) (← links)
- A Bayesian Approach for Step-Stress-Accelerated Life Tests for One-Shot Devices Under Exponential Distributions (Q5051085) (← links)
- A Bayesian Approach for the Analysis of Tumorigenicity Data from Sacrificial Experiments Under Weibull Lifetimes (Q5051095) (← links)
- OPTIMAL DESIGN OF SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR ONE-SHOT DEVICES UNDER EXPONENTIAL DISTRIBUTIONS (Q5056606) (← links)
- Copula models for one-shot device testing data with correlated failure modes (Q5078871) (← links)
- A hierarchical Bayes analysis for one-shot device testing experiment under the assumption of exponentiality (Q5084917) (← links)
- Analysis of non-repairable cold-standby systems in Bayes theory (Q5222461) (← links)
