Pages that link to "Item:Q421820"
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The following pages link to Generalized beta prior models on fraction defective in reliability test planning (Q421820):
Displaying 14 items.
- Optimum attributes component test plans for \(k\)-out-of-\(n:F\) Weibull systems using prior information (Q300038) (← links)
- Economic lot sampling inspection from defect counts with minimum conditional value-at-risk (Q1751676) (← links)
- Minimizing the area of a Pareto confidence region (Q1926837) (← links)
- Optimal truncated repetitive lot inspection with defect rates (Q1985091) (← links)
- Computing tolerance limits for the lifetime of a \(k\)-out-of-\(n\):\(F\) system based on prior information and censored data (Q1991364) (← links)
- Efficient truncated repetitive lot inspection using Poisson defect counts and prior information (Q2023984) (← links)
- Balancing producer and consumer risks in optimal attribute testing: a unified Bayesian/frequentist design (Q2184150) (← links)
- Optimal lot sentencing based on defective counts and prior acceptability (Q2223885) (← links)
- Computing optimal confidence sets for Pareto models under progressive censoring (Q2252204) (← links)
- Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis (Q2255932) (← links)
- Explicit quasi-optimal inspection schemes from nonconformity count data with controlled producer and consumer risks (Q2281815) (← links)
- Controlling posterior producer and consumer risks in lot reinspection (Q2281834) (← links)
- Optimal lot disposition from Poisson-Lindley count data (Q2310620) (← links)
- Best prediction regions for future exponential record intervals (Q4999846) (← links)
