Economic lot sampling inspection from defect counts with minimum conditional value-at-risk (Q1751676)
From MaRDI portal
!
This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:
scientific article; zbMATH DE number 6873527
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Economic lot sampling inspection from defect counts with minimum conditional value-at-risk |
scientific article; zbMATH DE number 6873527 |
Statements
Economic lot sampling inspection from defect counts with minimum conditional value-at-risk (English)
0 references
25 May 2018
0 references
quality control
0 references
acceptance sampling
0 references
constrained optimization
0 references
integer nonlinear programming
0 references
Poisson defect rate
0 references
0 references
0 references
0 references
0 references
0 references
0 references
0 references
0 references
0.8774116
0 references
0.86106163
0 references
0.8602865
0 references
0.8584423
0 references
0.8578392
0 references
0.85088336
0 references
0.8468275
0 references
