Pages that link to "Item:Q5503764"
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The following pages link to Optimum step‐stress accelerated life test plans for log‐location‐scale distributions (Q5503764):
Displayed 7 items.
- Estimation in step-stress accelerated life tests for the exponentiated exponential distribution with type-I censoring (Q961278) (← links)
- Bayesian planning of optimal step-stress accelerated life test for log-location-scale distributions (Q1709418) (← links)
- Optimal designs for step-stress models under interval censoring (Q2321789) (← links)
- How do heterogeneities in operating environments affect field failure predictions and test planning? (Q2441859) (← links)
- Optimum step-stress accelerated degradation test for Wiener degradation process under constraints (Q2629683) (← links)
- Optimal Robust Designs of Step-Stress Accelerated Life Testing Experiments for Proportional Hazards Models (Q2958822) (← links)
- Planning step-stress test plans under Type-I censoring for the log-location-scale case (Q5218920) (← links)