Pages that link to "Item:Q736577"
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The following pages link to Bayesian accelerated life testing under competing log-location-scale family of causes of failure (Q736577):
Displayed 4 items.
- Change-point detection of failure mechanism for electronic devices based on Arrhenius model (Q2182931) (← links)
- Bayesian accelerated life test plans for series systems with Weibull component lifetimes (Q2306784) (← links)
- Bayesian<i>D</i>-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure (Q5138096) (← links)
- Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data (Q6068060) (← links)