Pages that link to "Item:Q3747577"

The following pages link to Limited Failure Population Life Tests: Application to Integrated Circuit Reliability (Q3747577):

Displaying 18 items.

• Proportional hazards models with discrete frailty (Q746065) (← links)
• A new threshold regression model for survival data with a cure fraction (Q746094) (← links)
• The mixed trunsored model with applications to SARS (Q878599) (← links)
• Extrapolation and confounding in accelerated material degradation and failure studies (Q1007430) (← links)
• A general hazard regression model for accelerated life testing (Q1960300) (← links)
• A stochastic version of the EM algorithm for mixture cure model with exponentiated Weibull family of lifetimes (Q2156017) (← links)
• A general approach for cure models in survival analysis (Q2215740) (← links)
• Approximate Bayesian inference for mixture cure models (Q2220802) (← links)
• Estimation of the number of failures in the Weibull model using the ordinary differential equation (Q2253389) (← links)
• Penalized spline estimation in varying coefficient models with censored data (Q2273026) (← links)
• Zero-adjusted reparameterized Birnbaum-Saunders regression model (Q2322586) (← links)
• A semiparametric mixture cure survival model for left-truncated and right-censored data (Q2980223) (← links)
• Comparisons of approximate confidence intervals for the smallest extreme value distribution simple linear regression model under time censoring (Q4019306) (← links)
• Estimation from k independent randomly truncated samples: application to neutrino energies (Q4202661) (← links)
• Survival analysis with long-term survivors and partially observed covariates (Q4529333) (← links)
• Bayesian burn-in procedures for limited failure populations (Q4807208) (← links)
• Identifiability of cure models (Q5953881) (← links)
• Bayesian solution to the monotone likelihood in the standard mixture cure model (Q6089502) (← links)