Pages that link to "Item:Q4952969"
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The following pages link to A hybrid finite element‐finite difference method for thermal analysis in X‐ray lithography (Q4952969):
Displayed 4 items.
- Mathematical model and computer simulation of three dimensional thin film elliptic interface problems (Q418274) (← links)
- An unconditionally stable finite difference scheme for solving a 3D heat transport equation in a sub-microscale thin film (Q1612401) (← links)
- A finite difference scheme for solving a three-dimensional heat transport equation in a thin film with microscale thickness (Q2709679) (← links)
- Hybrid asymptotic-numerical modeling of thin layers for dynamic thermal analysis of structures (Q2967466) (← links)