Pages that link to "Item:Q5503764"
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The following pages link to Optimum step‐stress accelerated life test plans for log‐location‐scale distributions (Q5503764):
Displaying 12 items.
- Estimation in step-stress accelerated life tests for the exponentiated exponential distribution with type-I censoring (Q961278) (← links)
- Bayesian planning of optimal step-stress accelerated life test for log-location-scale distributions (Q1709418) (← links)
- Planning step-stress test plans under type-I hybrid censoring for the log-location-scale distribution (Q2218632) (← links)
- Bayesian order-restricted inference of a Weibull multi-step step-stress model (Q2241548) (← links)
- Optimal designs for step-stress models under interval censoring (Q2321789) (← links)
- How do heterogeneities in operating environments affect field failure predictions and test planning? (Q2441859) (← links)
- Optimum step-stress accelerated degradation test for Wiener degradation process under constraints (Q2629683) (← links)
- Optimal Robust Designs of Step-Stress Accelerated Life Testing Experiments for Proportional Hazards Models (Q2958822) (← links)
- (Q5046133) (← links)
- Inference on constant stress accelerated life tests for log-location-scale lifetime distributions with type-I hybrid censoring (Q5107351) (← links)
- Planning step-stress test plans under Type-I censoring for the log-location-scale case (Q5218920) (← links)
- Estimating the Pareto parameters under progressive censoring data for constant-partially accelerated life tests (Q5220763) (← links)
