AS 218
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Cited in
(6)- Bayesian design for accelerated life testing
- Limited Failure Population Life Tests: Application to Integrated Circuit Reliability
- scientific article; zbMATH DE number 966909 (Why is no real title available?)
- Optimum simple ramp-tests for the Weibull distribution and type-I censoring
- Probabilistic-statistical programs from ``Applied Statistics
- Planning Accelerated Life Tests with Two or More Experimental Factors
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