Limited Failure Population Life Tests: Application to Integrated Circuit Reliability
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- A stochastic version of the EM algorithm for mixture cure model with exponentiated Weibull family of lifetimes
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- Estimation of the number of failures in the Weibull model using the ordinary differential equation
- Penalized spline estimation in varying coefficient models with censored data
- Zero-adjusted reparameterized Birnbaum-Saunders regression model
- A semiparametric mixture cure survival model for left-truncated and right-censored data
- Breakdown bounds and expected test resistance
- Effects of manufacturing defects on the device failure rate
- Comparisons of approximate confidence intervals for the smallest extreme value distribution simple linear regression model under time censoring
- Estimation from k independent randomly truncated samples: application to neutrino energies
- Survival analysis with long-term survivors and partially observed covariates
- Bayesian burn-in procedures for limited failure populations
- Data Mining and Diagnosing IC Fails
- Identifiability of cure models
- Bayesian solution to the monotone likelihood in the standard mixture cure model
- Gompertz zero-inflated cure rate regression models applied to credit risk data
- A two-step estimation procedure for semiparametric mixture cure models
- On a reparameterization of a flexible family of cure models
- Accelerated Event Times with Multiple Thresholds
- Causal inference for time-to-event data with a cured subpopulation
- Proportional hazards models with discrete frailty
- A new threshold regression model for survival data with a cure fraction
- The mixed trunsored model with applications to SARS
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