A Comparison of Several Component-Testing Plans For A Parallel System

DOI10.1109/TR.1987.5222428MaRDI QIDQ3761518zbMATH OpenFDO

Authors Jia-Her Yan, Mainak Mazumdar

Publication date 1987

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TR.1987.5222428

zbMATH Keywords

comparison of component-testing plansconsumer riskcost minimizationlife testmaximum likelihood estimateoptimizationparallel systemproducer risksystem reliabilitytype-I censoring

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Cited in

(3)

• Construction of optimal reliability test plans for binary type multi-state strongly coherent systems
• Application of Arithmetic-Geometric Mean Inequality for Construction of Reliability Test Plan for Parallel Systems in the Presence of Covariates
• Optimal component test plans for a parallel system based on type-II censoring

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