Optimal component test plans for a parallel system based on type-II censoring

DOI10.1016/J.STAMET.2007.11.001MaRDI QIDQ713880zbMATH OpenOpenAlexFDO

Authors P. Vellaisamy, Mahesh Kumar

Publication date 19 October 2012

Published in Statistical Methodology (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.stamet.2007.11.001

zbMATH Keywords

algorithmscomponent test plansconsumer's riskexponential lifetimesinteger programmingmaximum likelihood estimatesparallel systemproducer's risksystem reliabilitytype-II censoring

Mathematics Subject Classification ID

Censored data models (62N01) Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30) Reliability, availability, maintenance, inspection in operations research (90B25) Mixed integer programming (90C11)

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Cites work

• A Comparison of Several Component-Testing Plans For A Parallel System
• A Component-Testing Procedure For A Parallel System With Type II Censoring
• A type-II censored, log test time based, component-testing procedure for a parallel system
• An Optimum Procedure for Component Testing in the Demonstration of Series System Reliability
• Designing Component Test Plans for Series System Reliability via Mathematical Programming
• Minimum cost component test plans for evaluating reliability of a highly reliable parallel system
• Two-stage component test plans for testing the reliability of a series system

Cited in

(6)

• A new plan for life-testing two-component parallel systems
• Design of optimal Bayesian reliability test plans for a parallel system based on type-II censoring
• A type-II censored, log test time based, component-testing procedure for a parallel system
• Two-stage component test plans for testing the reliability of a series system
• Application of Arithmetic-Geometric Mean Inequality for Construction of Reliability Test Plan for Parallel Systems in the Presence of Covariates
• Design of component reliability test plan for a series system having time dependent testing cost with the presence of covariates

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