A Monte Carlo percolative approach to reliability analysis of semiconductor structures

DOI10.1016/S0378-4754(00)00266-4MaRDI QIDQ5938382zbMATH OpenWikidataFDO

Authors C. Pennetta, L. Reggiani, Gy. Trefán

Publication date 18 July 2001

Published in Mathematics and Computers in Simulation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/S0378-4754(00)00266-4

zbMATH Keywords

Joule heatingIntegrated circuitsMonte Carlo percolative approach

Mathematics Subject Classification ID

Statistical mechanics of semiconductors (82D37)

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