A bounded intensity process reliability growth model in a Bayes decision framework

DOI10.1515/EQC.2010.013MaRDI QIDQ2915359zbMATH OpenOpenAlexFDO

Authors Preeti Wanti Srivastava, Nidhi Jain

Publication date 16 September 2012

Published in Economic Quality Control (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1515/eqc.2010.013

zbMATH Keywords

break-even valuenon-homogenous Poisson processtest-find-test program

Mathematics Subject Classification ID

Bayesian problems; characterization of Bayes procedures (62C10) Reliability and life testing (62N05)

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Cites work

• A New Nonparametric Growth Model
• A nonparametric-Bayes reliability-growth model

Cited in

(1)

• Cost–benefit modelling for reliability growth

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