Parametric Bayesian Markov model of reliability growth by testing and development

MaRDI QIDQ1185658zbMATH OpenFDO

Authors V. B. Chernyavskij, V. P. Savchuk

Publication date 28 June 1992

Published in Automation and Remote Control (Search for Journal in Brave)

zbMATH Keywords

Bayesian approachdependence of reliability measures on test resultsMarkov sequence

Mathematics Subject Classification ID

Applications of renewal theory (reliability, demand theory, etc.) (60K10) Reliability and life testing (62N05)

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Cited in

(7)

• A bounded intensity process reliability growth model in a Bayes decision framework
• Bayesian synthetic evaluation of multistage reliability growth with instant and delayed fix modes
• A dynamic Bayesian evaluation method of reliability growth for exponential life systems
• Generalized beta prior models on fraction defective in reliability test planning
• A Bayes method for assessing product-reliability during development testing
• Estimating production test properties from test measurement data
• Recursive models of reliability growth

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