A parameterized algorithm for upward planarity testing

DOI10.1007/978-3-540-30140-0_16MaRDI QIDQ5464575zbMATH OpenOpenAlexFDO

Authors Hubert Y. Chan

Publication date 18 August 2005

Published in Lecture Notes in Computer Science (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/b100428

Mathematics Subject Classification ID

Graph algorithms (graph-theoretic aspects) (05C85) Graph theory (including graph drawing) in computer science (68R10)

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Cited in

(27)

• Orthogonal planarity testing of bounded treewidth graphs
• Upward planar drawings with three and more slopes
• Quasi-upward planar drawings with minimum curve complexity
• Parameterized analysis and crossing minimization problems
• Sketched representations and orthogonal planarity of bounded treewidth graphs
• Upward and quasi-upward planarity testing of embedded mixed graphs
• On the computational complexity of upward and rectilinear planarity testing
• Upward planarity testing in practice: SAT formulations and comparative study
• Upward Planarity Testing: A Computational Study
• An Improved Upward Planarity Testing Algorithm and Related Applications
• Optimal Upward Planarity Testing of Single-Source Digraphs
• Upward planar drawings with two slopes
• TWO FIXED-PARAMETER TRACTABLE ALGORITHMS FOR TESTING UPWARD PLANARITY
• SOFSEM 2005: Theory and Practice of Computer Science
• Upward Planar Drawings with Three and More Slopes
• Graph Drawing
• Graph Drawing
• Testing upward planarity of partial 2-trees
• Upward planarity testing of biconnected outerplanar DAGs solves partition
• Grid recognition: classical and parameterized computational perspectives
• Parameterized algorithms for upward planarity
• Upward and orthogonal planarity are W[1]-hard parameterized by treewidth
• Drawn tree decomposition: new approach for graph drawing problems
• Upward and rectilinear planarity are W[1]-hard parameterized by treewidth
• Maximum upward planar subgraphs of embedded planar digraphs
• Upward drawings of triconnected digraphs.
• Improving the running time of embedded upward planarity testing

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