A probabilistic approach for testing large-scale integrated circuits

DOI10.1007/BF00991634MaRDI QIDQ4186230zbMATH OpenOpenAlexFDO

Authors S. S. Singh, Vijendra Pal. Singh

Publication date 1978

Published in International Journal of Computer & Information Sciences (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/bf00991634

zbMATH Keywords

Circuit TestingLarge-Scale Integrated Logic Circuit ChipsQuality ControlReliability

Mathematics Subject Classification ID

Reliability and life testing (62N05)

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