Algorithm study for VLSI interconnections

DOI10.1007/BF02919433MaRDI QIDQ1267209zbMATH OpenFDO

Authors Yang Zhao, Yunyi Wang

Publication date 22 March 1999

Published in Science in China. Series E (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/BF02919433

zbMATH Keywords

finite element methodnumerical experimentsVLSI circuitVLSI interconnectionswave-front technique

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) Hardware implementations of nonnumerical algorithms (VLSI algorithms, etc.) (68W35) Technical applications of optics and electromagnetic theory (78A55)

Review text

A finite element method for capacitance calculation of VLSI interconnections is investigated. The proposed method incorporates geometry independent measured equation of invariance which was earlier proposed for mesh truncation. In order to speed-up the solution calculation, the wave-front technique is modified to solve finite element equation incorporating substructure concept. The numerical experiments presented in the last part of the article demonstrate the feasibility of the proposed method for VLSI interconnect.

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• Applying iterative methods to the analysis of VLSI circuits
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