An Alternating Direction Method of Multipliers for Inverse Lithography Problem
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Abstract: We propose an alternating direction method of multipliers (ADMM) to solve an optimization problem stemming from inverse lithography. The objective functional of the optimization problem includes three terms: the misfit between the imaging on wafer and the target pattern, the penalty term which ensures the mask is binary and the total variation regularization term. By variable splitting, we introduce an augmented Lagrangian for the original objective functional. In the framework of ADMM method, the optimization problem is divided into several subproblems. Each of the subproblems can be solved efficiently. We give the convergence analysis of the proposed method. Specially, instead of solving the subproblem concerning sigmoid, we solve directly the threshold truncation imaging function which can be solved analytically. We also provide many numerical examples to illustrate the effectiveness of the method.
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Cites work
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- scientific article; zbMATH DE number 936298 (Why is no real title available?)
- scientific article; zbMATH DE number 5060482 (Why is no real title available?)
- Image Processing and Analysis
- Lectures on convex optimization
- The Split Bregman Method for L1-Regularized Problems
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