Analysis of admittance data: Comparison of a parametric and a nonparametric method

DOI10.1006/JCPH.1999.6269MaRDI QIDQ1302910zbMATH OpenOpenAlexFDO

Authors V. Pereyra

Publication date 13 August 2000

Published in Journal of Computational Physics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1006/jcph.1999.6269

zbMATH Keywords

inverse problemTikhonov regularizationMonte Carlo studyparametric methodsemiconductorill-posed inverse problemnon-parametric methodadmittance spectroscopyGaAs Schottky diode

Mathematics Subject Classification ID

Motion of charged particles (78A35) Statistical mechanics of semiconductors (82D37)

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Cites work

• scientific article; zbMATH DE number 3868512 (Why is no real title available?)
• scientific article; zbMATH DE number 3974187 (Why is no real title available?)
• scientific article; zbMATH DE number 1218292 (Why is no real title available?)
• Tikhonovs regularization method for ill-posed problems. A comparison of different methods for the determination of the regularization parameter

Cited in

(4)

• Parameter estimation in equivalent circuit analysis of dielectric cure monitoring signals using genetic algorithms
• Analysis of nonexponential capacitance relaxation signals
• Comparison of parametric and nonparametric methods for the analysis and inversion of immittance data: critique of earlier work.
• A fresh look at the semiconductor bandgap using constant current data

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