Assignment and allocation of highly testable data paths under scan optimization
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Recommendations
- Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction
- On the Switching Activity and Static Test Compaction of Multicycle Scan-Based Tests
- Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction
- Optimal allocation of test case considering testing-resource in partition testing
- A storage-based built-in test pattern generation method for scan circuits based on partitioning and reduction of a precomputed test set
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