On the Switching Activity and Static Test Compaction of Multicycle Scan-Based Tests

DOI10.1109/TC.2011.184MaRDI QIDQ5274659zbMATH OpenOpenAlexFDO

Authors Irith Pomeranz

Publication date 12 July 2017

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.2011.184

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cited in

(1)

• Assignment and allocation of highly testable data paths under scan optimization

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