Irith Pomeranz

MaRDI QIDQ2982031zbMATH OpenFDO

List of research outcomes

This list is not complete and representing at the moment only items from zbMATH Open and arXiv. We are working on additional sources - please check back here soon!

Publication	Date of Publication	Type
Polynomial complexity algorithms for increasing the testability of digital circuits by testing-module insertion IEEE Transactions on Computers	2018-09-14	Paper
A storage-based built-in test pattern generation method for scan circuits based on partitioning and reduction of a precomputed test set IEEE Transactions on Computers	2018-07-09	Paper
Signal-Transition Patterns of Functional Broadside Tests IEEE Transactions on Computers	2017-10-19	Paper
Equivalence, Dominance, and Similarity Relations between Fault Pairs and a Fault Pair Collapsing Process for Fault Diagnosis IEEE Transactions on Computers	2017-07-27	Paper
On the Computation of Common Test Data for Broadside and Skewed-Load Tests IEEE Transactions on Computers	2017-07-12	Paper
Fast Identification of Undetectable Transition Faults under Functional Broadside Tests IEEE Transactions on Computers	2017-07-12	Paper
Concatenation of Functional Test Subsequences for Improved Fault Coverage and Reduced Test Length IEEE Transactions on Computers	2017-07-12	Paper
On the Switching Activity and Static Test Compaction of Multicycle Scan-Based Tests IEEE Transactions on Computers	2017-07-12	Paper
An Adjacent Switching Activity Metric under Functional Broadside Tests IEEE Transactions on Computers	2017-07-12	Paper
Sharing Logic for Built-In Generationof Functional Broadside Tests IEEE Transactions on Computers	2017-06-20	Paper
-Based Generation of Partially-Functional Broadside Tests IEEE Transactions on Computers	2017-05-16	Paper
Two-Dimensional Static Test Compaction for Functional Test Sequences IEEE Transactions on Computers	2017-05-16	Paper
Test Vector Omission for Fault Coverage Improvement of Functional Test Sequences IEEE Transactions on Computers	2017-05-16	Paper
Improving the Accuracy of Defect Diagnosis with Multiple Sets of Candidate Faults IEEE Transactions on Computers	2017-05-16	Paper
Piecewise-Functional Broadside Tests Based on Reachable States IEEE Transactions on Computers	2017-05-16	Paper
INCREDYBLE: A new search strategy for design automation problems with applications to testing IEEE Transactions on Computers	2003-10-14	Paper
Delay fault models for VLSI circuits Integration	1999-01-12	Paper
scientific article; zbMATH DE number 922894 (Why is no real title available?)	1996-11-20	Paper
On the number of tests to detect all path delay faults in combinational logic circuits IEEE Transactions on Computers	1996-01-01	Paper
On removing redundancies from synchronous sequential circuits with synchronizing sequences IEEE Transactions on Computers	1996-01-01	Paper
On fault simulation for synchronous sequential circuits IEEE Transactions on Computers	1995-01-01	Paper
On the role of hardware reset in synchronous sequential circuit test generation IEEE Transactions on Computers	1994-01-01	Paper

Research outcomes over time

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