Code-based test generation for validation of functional processor descriptions

DOI10.1007/3-540-36577-X_41MaRDI QIDQ4417958zbMATH OpenFDO

Authors Fabrice Baray, Philippe Codognet, Daniel Diaz, Henri Michel

Publication date 30 July 2003

Published in Lecture Notes in Computer Science (Search for Journal in Brave)

Full work available at URL http://link.springer.de/link/service/series/0558/bibs/2619/26190569.htm

zbMATH Keywords

Code-based test generationconstraint solving techniquesfunctional hardware verification

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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(9)

• Generation of test data for verification of caching mechanisms and address translation in microprocessors
• Wombit: a portfolio bit-vector solver using word-level propagation
• Efficient techniques for automatic verification-oriented test set optimization
• Functional Testing of Microprocessors
• Microprocessor architectural automatic test program generation
• High-level synthesis techniques for functional test pattern execution
• An enhanced framework for microprocessor test-program generation
• Exploiting auto-adaptive GP for highly effective test programs generation
• scientific article; zbMATH DE number 2204028 (Why is no real title available?)

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