Complete tests relative to displacing faults of inputs of circuits
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Recommendations
- Tests with stuck-at and shift faults on circuit inputs
- Tests concerning certain types of faults at the scheme inputs
- On tests detecting certain faults of circuit inputs for almost all Boolean functions
- Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
- On the length of diagnostic tests for Boolean circuits
Cites work
- scientific article; zbMATH DE number 3877089 (Why is no real title available?)
- scientific article; zbMATH DE number 3487367 (Why is no real title available?)
- scientific article; zbMATH DE number 3510201 (Why is no real title available?)
- scientific article; zbMATH DE number 3397423 (Why is no real title available?)
- Diagnostic tests for local coalescences of variables in Boolean functions
- On complete fault-detection tests under local coalescences of variables in Boolean functions
Cited in
(8)- Tests with stuck-at and shift faults on circuit inputs
- On diagnostic test sets for local mirror reflections on circuit inputs
- scientific article; zbMATH DE number 4106777 (Why is no real title available?)
- Exhaustive testing of almost all devices with outputs depending on limited number of inputs
- On tests detecting certain faults of circuit inputs for almost all Boolean functions
- On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits
- Tests concerning certain types of faults at the scheme inputs
- Diagnostic tests for discrete functions defined on rings
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