Constructing optimal four-level designs via Gray map code
In this paper the authors present a method to construct four-level symmetric designs with good uniformity properties, namely with low values of Lee discrepancy. The construction is based on the Gray map code, i.e., a binary design is defined first, and then two columns of the binary design are used to define a column in the four-level design. The main result in the paper is Theorem 5.1. It states that if the underlying binary design has less generalized aberration, then the four-level design built up with the Gray map has good properties in terms of Lee discrepancy.
- An adjusted gray map technique for constructing large four-level uniform designs
- New results on quaternary codes and their Gray map images for constructing uniform designs
- A systematic construction approach for nonregular fractional factorial four-level designs via quaternary linear codes
- Construction of multi-level space-filling designs via code mappings
- Construction of four-level designs for computer experiments
- On the construction of optimal linear codes of dimension four
- The preparata codes and a class of 4‐designs
- A construction of D-optimal designs for N 2 mod 4
- \(\mathbb {Z}_{4}\)-codes and their Gray map images as orthogonal arrays
- A code arithmetic approach for quaternary code designs and its application to \((1/64)\)th-fractions
- A note on generalized aberration in factorial designs
- A trigonometric approach to quaternary code designs with application to one-eighth and one-sixteenth fractions
- Generalized minimum aberration for asymmetrical fractional factorial designs.
- scientific article; zbMATH DE number 3742439 (Why is no real title available?)
- scientific article; zbMATH DE number 3776707 (Why is no real title available?)
- scientific article; zbMATH DE number 2015211 (Why is no real title available?)
- Lee discrepancy and its applications in experimental designs
- Lower bounds for centered and wrap-around \(L_2\)-discrepancies and construction of uniform designs by threshold accepting.
- Minimum Aberration 2 k-p Designs
- New lower bounds for Lee discrepancy on two and three mixed levels factorials
- Quarter-fraction factorial designs constructed via quaternary codes
- Some new lower bounds to centered and wrap-round \(L_2\)-discrepancies
- Two-level nonregular designs from quaternary linear codes
- Uniform four-level designs from two-level designs: a new look
- New results on quaternary codes and their Gray map images for constructing uniform designs
- A systematic construction approach for nonregular fractional factorial four-level designs via quaternary linear codes
- Construction of four-level and mixed-level designs with zero Lee discrepancy
- Uniform four-level designs from two-level designs: a new look
- Construction of four-level designs for computer experiments
- Theory of J-characteristics of four-level designs under quaternary codes
- A novel coding scheme for generating sixteen codes from quaternary codes with applications
- A class of mixed-level uniform designs generated by code mapping
- Construction on large four-level designs via quaternary codes
- Mixed-level uniform design with random errors in the level values
- Lower bounds for the symmetric L₂-discrepancy of U-type designs
- Deterministic construction methods for asymmetrical uniform designs
- Uniformity of mixed two- and four-level designs under quaternary codes
- New lower bounds of four-level and two-level designs via two transformations
This page was built for publication: Constructing optimal four-level designs via Gray map code
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2312028)
