Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences

DOI10.1109/T-C.1971.223077MaRDI QIDQ5615043zbMATH OpenFDO

Authors Peter N. Marinos

Publication date 1971

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/T-C.1971.223077

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cited in

(7)

• Complete test-set generation for bridging faults in combinational-logic circuits
• Boolean integral calculus
• An efficient algorithm for single and multiple fault test sets generation
• A graph-theoretic multiple logic fault analysis through petri-nets
• Algebraic analysis of multiple faults in combinational networks
• Boolean difference techniques in fault tree analysis
• Transition submatrices in regular homing experiments and identification of sequential machines of known class using direct-sum transition matrices

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