Design and Application of Self-Testing Comparators Implemented with MOS PLA's

DOI10.1109/TC.1984.1676473MaRDI QIDQ3220499zbMATH OpenOpenAlexFDO

Authors Yuval Tamir, Carlo H. Séquin

Publication date 1984

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1984.1676473

zbMATH Keywords

concurrent error detectionduplicationfault-tolerant system designfaults in VLSI circuitsmatchingMOS PLA fault modelself-testing comparator

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

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• Self-checking comparator with one periodic output

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