Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor

DOI10.1109/TC.1980.1675615MaRDI QIDQ3877575zbMATH OpenOpenAlexFDO

Authors Yves Crouzet, Christian Landrault

Publication date 1980

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1980.1675615

zbMATH Keywords

fault detectionMOS-LSI circuitsself-checking

Mathematics Subject Classification ID

Cited in

(1)

• Techniques for efficiently implementing totally self-checking checkers in MOS technology

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