Design of accelerated life testing plans under multiple stresses
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Recommendations
- Optimal designs for accelerated life tests with multiple stress factors and heteroscedasticity
- Accelerated life test planning with independent lognormal competing risks
- Investigation of equivalent step-stress testing plans
- Equivalent accelerated life testing plans for log-location-scale distributions
- Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor
Cited in
(19)- Design and analysis of accelerated life testing and its application under rebate warranty. Accelerated life testing
- Accelerated life test planning with independent lognormal competing risks
- Simulation-based Bayesian optimal design for multi-factor accelerated life tests
- Double synchronous-step-down-stress accelerated life testing method
- Planning Accelerated Life Tests with Two or More Experimental Factors
- scientific article; zbMATH DE number 3868461 (Why is no real title available?)
- Equivalent accelerated life testing plans for log-location-scale distributions
- Optimal design of accelerated life testing plans for periodical replacement with penalty
- Investigation of equivalent step-stress testing plans
- scientific article; zbMATH DE number 4007531 (Why is no real title available?)
- Planning accelerated life tests with random effects of test chambers
- Optimal designs for accelerated life tests with multiple stress factors and heteroscedasticity
- Optimal design of accelerated life tests with two stresses
- Standardized lifetime-capability and warranty-return-rate-based suppliers qualification and selection with accelerated Weibull-life type II testing data
- Optimal sample size allocation for accelerated life test under progressive type-II censoring with competing risks
- Optimal progressive interval censoring plan under accelerated life test with limited budget
- Sequential selection for accelerated life testing via approximate Bayesian inference
- Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring
- Accelerated life test for Pareto distribution under progressive type-II censored competing risks data with binomial removals and its application in electrode insulation system
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