Detection oF Pattern-Sensitive Faults in Random-Access Memories

DOI10.1109/T-C.1975.224182MaRDI QIDQ4053488zbMATH OpenFDO

Authors John P. Hayes

Publication date 1975

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/T-C.1975.224182

Mathematics Subject Classification ID

Formal languages and automata (68Q45)

Cited in

(3)

• Analysis of multibackground memory testing techniques
• Universal Address Sequence Generator for Memory Built-in Self-test*
• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests

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