Analysis of multibackground memory testing techniques

DOI10.2478/V10006-010-0014-6MaRDI QIDQ2930586zbMATH OpenOpenAlexFDO

Authors Ireneusz Mrozek

Publication date 19 November 2014

Published in International Journal of Applied Mathematics and Computer Science (Search for Journal in Brave)

Full work available at URL https://doi.org/10.2478/v10006-010-0014-6

zbMATH Keywords

March testsmultibackground testingpattern sensitive faultsRAM testing

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

Recommendations

• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests
• The repeated nondestructive march tests with variable address sequences
• Nondestructive RAM testing by analyzing the output data for symmetry
• Fault Propagation Through Embedded Multiport Memories
• Modeling and simulation of efficient March algorithm for memory testing

Cites work

• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests
• Detection oF Pattern-Sensitive Faults in Random-Access Memories
• Testing Memories for Single-Cell Pattern-Sensitive Faults
• Theory of transparent BIST for RAMs

Cited in

(5)

• Multiple controlled random testing
• The repeated nondestructive march tests with variable address sequences
• Nondestructive RAM testing by analyzing the output data for symmetry
• Modeling and simulation of efficient March algorithm for memory testing
• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests

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