The repeated nondestructive march tests with variable address sequences

DOI10.1134/S000511790704011XzbMATH Open1127.68009MaRDI QIDQ2371625FDOQ2371625

Authors: Vyacheslav Yarmolik, S. V. Yarmolik 

Publication date: 5 July 2007

Published in: Automation and Remote Control (Search for Journal in Brave)

Recommendations

• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests
• Analysis of multibackground memory testing techniques
• Testing Memories for Single-Cell Pattern-Sensitive Faults
• Nondestructive RAM testing by analyzing the output data for symmetry
• Universal Address Sequence Generator for Memory Built-in Self-test*

zbMATH Keywords

random access memory

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

Cites Work

• Nondestructive RAM testing by analyzing the output data for symmetry
• Theory of transparent BIST for RAMs

Cited In (10)

• March Test Generation Revealed
• Multiple controlled random testing
• Analysis of multibackground memory testing techniques
• Universal Address Sequence Generator for Memory Built-in Self-test*
• Synthesis of test sequences with a given switching activity
• Testing Memories for Single-Cell Pattern-Sensitive Faults
• Nondestructive RAM testing by analyzing the output data for symmetry
• Modeling and simulation of efficient March algorithm for memory testing
• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests
• Controlled random tests

This page was built for publication: The repeated nondestructive march tests with variable address sequences

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2371625)