The repeated nondestructive march tests with variable address sequences

DOI10.1134/S000511790704011XMaRDI QIDQ2371625zbMATH OpenFDO

Authors Vyacheslav Yarmolik, S. V. Yarmolik

Publication date 5 July 2007

Published in Automation and Remote Control (Search for Journal in Brave)

zbMATH Keywords

random access memory

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

Recommendations

• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests
• Analysis of multibackground memory testing techniques
• Testing Memories for Single-Cell Pattern-Sensitive Faults
• Nondestructive RAM testing by analyzing the output data for symmetry
• Universal Address Sequence Generator for Memory Built-in Self-test*

Cites work

• Nondestructive RAM testing by analyzing the output data for symmetry
• Theory of transparent BIST for RAMs

Cited in

(10)

• Universal Address Sequence Generator for Memory Built-in Self-test*
• Synthesis of test sequences with a given switching activity
• March Test Generation Revealed
• Modeling and simulation of efficient March algorithm for memory testing
• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests
• Testing Memories for Single-Cell Pattern-Sensitive Faults
• Controlled random tests
• Analysis of multibackground memory testing techniques
• Nondestructive RAM testing by analyzing the output data for symmetry
• Multiple controlled random testing

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