| Publication | Date of Publication | Type |
|---|
Universal Address Sequence Generator for Memory Built-in Self-test*
Fundamenta Informaticae | 2023-03-09 | Paper |
Synthesis of test sequences with a given switching activity
Automation and Remote Control | 2022-05-17 | Paper |
Multiple controlled random testing
Fundamenta Informaticae | 2017-03-22 | Paper |
Iddq testing-based diagnosis of faults in CMOS-circuits
Automation and Remote Control | 2013-11-11 | Paper |
Controlled random tests
Automation and Remote Control | 2013-11-05 | Paper |
Antirandom test vectors for BIST in hardware/software systems
Fundamenta Informaticae | 2012-09-06 | Paper |
The repeated nondestructive march tests with variable address sequences
Automation and Remote Control | 2007-07-05 | Paper |
Pseudorandom test pattern generators for built-in self-testing: a power reduction method
Automation and Remote Control | 2005-08-08 | Paper |
Nondestructive RAM testing by analyzing the output data for symmetry
Automation and Remote Control | 2005-06-17 | Paper |
Built-in self-test scanners for very large-scale integration: a new design approach
Automation and Remote Control | 2004-10-19 | Paper |
Nondestructive testing of memory elements by built-in parity-check facilities
Automation and Remote Control | 2004-10-18 | Paper |
IDDQ testing technology for one-dimensional iterative logic arrays
Automation and Remote Control | 2004-10-13 | Paper |
The synthesis of optimal signature analyzer in the organization of monitoring of logical control units
Journal of Computer and Systems Sciences International | 1998-10-18 | Paper |
Synthesis of transformers of pseudorandom codes for testing digital schemes
Automation and Remote Control | 1997-03-16 | Paper |
Choice of optimal multiparametric probability distributions of input variables for probabilistic testing of digital circuits
Automation and Remote Control | 1996-06-12 | Paper |
scientific article; zbMATH DE number 862272 (Why is no real title available?)
| 1996-05-21 | Paper |
Boundary scan and its application to the testing of digital devices
Automation and Remote Control | 1995-02-19 | Paper |
Calculation of signatures of regular periodic sequences
Automation and Remote Control | 1994-03-22 | Paper |
scientific article; zbMATH DE number 220147 (Why is no real title available?)
| 1993-06-29 | Paper |
scientific article; zbMATH DE number 47895 (Why is no real title available?)
| 1992-09-17 | Paper |
Analysis of signature testability of digital circuits
Automation and Remote Control | 1992-06-25 | Paper |
Reliability of compact testing methods
Automation and Remote Control | 1992-06-25 | Paper |
Synthesis of a signature analyzer for two-level combinational circuits
Automation and Remote Control | 1990-01-01 | Paper |
Synthesis of pseudorandom test pattern generators
Automation and Remote Control | 1988-01-01 | Paper |
scientific article; zbMATH DE number 4168446 (Why is no real title available?)
| 1987-01-01 | Paper |
Designing generators of pseudorandom sequences of test signals
Automation and Remote Control | 1983-01-01 | Paper |
