Theory of transparent BIST for RAMs

DOI10.1109/12.543708MaRDI QIDQ4420831zbMATH OpenOpenAlexFDO

Authors Michael Nicolaidis

Publication date 1996

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/12.543708

zbMATH Keywords

RAM test algorithmssignature analysis

Mathematics Subject Classification ID

Data encryption (aspects in computer science) (68P25)

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Cited in

(6)

• The repeated nondestructive march tests with variable address sequences
• Analysis of multibackground memory testing techniques
• Modeling and simulation of efficient March algorithm for memory testing
• BIST for systems-on-a-chip
• Aliasing error for a mask ROM built-in self-test
• Binary programming-based transparency path construction for SoC test access

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