An ALU-Based BIST Scheme for Word-Organized RAMs

DOI10.1109/TC.2007.70835MaRDI QIDQ4589569zbMATH OpenOpenAlexFDO

Authors Ioannis K. Voyiatzis

Publication date 10 November 2017

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.2007.70835

Mathematics Subject Classification ID

Information storage and retrieval of data (68P20) Reliability, testing and fault tolerance of networks and computer systems (68M15)

Cited in

(2)

• A Low-Cost Mechanism Exploiting Narrow-Width Values for Tolerating Hard Faults in ALU
• Theory of transparent BIST for RAMs

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