Aliasing error for a mask ROM built-in self-test

DOI10.1109/12.485566MaRDI QIDQ4420922zbMATH OpenOpenAlexFDO

Authors Kazuhiko Iwasaki, Shigeo Nakamura

Publication date 1996

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/12.485566

zbMATH Keywords

experimental faults analysis

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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