Detection of Faults in Programmable Logic Arrays

DOI10.1109/TC.1979.1675264MaRDI QIDQ3856651zbMATH OpenOpenAlexFDO

Authors James Edward Smith

Publication date 1979

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1979.1675264

zbMATH Keywords

fault detectionmultiple faultsprogrammable logic arraystest generation

Mathematics Subject Classification ID

Cited in

(2)

• An easily testable optimal-time VLSI-multiplier
• Easy test generation PLAs

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