Easy test generation PLAs

DOI10.1007/BF02943319zbMath0632.94025OpenAlexW2064725600MaRDI QIDQ1095867

Yinghua Min

Publication date: 1987

Published in: Journal of Computer Science and Technology (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/bf02943319

zbMATH Keywords

hardwarecomplete test setlarge circuitsProgrammable Logic ArraysTest Generation

Mathematics Subject Classification ID

Related Items (1)

Easy test generation PLAs

Cites Work

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• Easy test generation PLAs
• Fault Analysis and Test Generation for Programmable Logic Arrays (PLA's)
• A Design for Testability of Undetectable Crosspoint Faults in Programmable Logic Arrays
• Detection of Faults in Programmable Logic Arrays
• Multiple Fault Detection in Programmable Logic Arrays
• A design of programmable logic arrays with universal tests

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