scientific article; zbMATH DE number 3590198
From MaRDI portal
Publication:4159312
zbMATH Open0378.94028MaRDI QIDQ4159312FDOQ4159312
Authors: Melvin A. Breuer, Arthur D. Friedman 
Publication date: 1977
Title of this publication is not available (Why is that?)
Formal languages and automata (68Q45) Introductory exposition (textbooks, tutorial papers, etc.) pertaining to computer science (68-01) Applications of Markov renewal processes (reliability, queueing networks, etc.) (60K20) Introductory exposition (textbooks, tutorial papers, etc.) pertaining to information and communication theory (94-01)
Cited In (8)
- Gate-delay-fault testability properties of multiplexor-based networks
- Functional test generation using binary decision diagrams
- Easy test generation PLAs
- Fast test generation for m-logic combinational circuits
- A graph partitioning heuristic for the parallel pseudo-exhaustive logical test of VLSI combinational circuits
- An efficient algorithm for calculating Boolean difference
- Complete test-set generation for bridging faults in combinational-logic circuits
- An optimum testing algorithm for some symmetric coherent systems
This page was built for publication:
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4159312)
