Fault Analysis and Test Generation for Programmable Logic Arrays (PLA's)

DOI10.1109/TC.1979.1675429zbMATH Open0414.94055OpenAlexW2024467749MaRDI QIDQ3050334FDOQ3050334

Authors: Daniel L. Ostapko, Se June Hong 

Publication date: 1979

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1979.1675429

zbMATH Keywords

test generationprogrammable logic arraysfault analysis

Mathematics Subject Classification ID

Cited In (1)

• Easy test generation PLAs

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