Yinghua Min

List of research outcomes

This list is not complete and representing at the moment only items from zbMATH Open and arXiv. We are working on additional sources - please check back here soon!

Publication	Date of Publication	Type
The monotonic increasing relationship between average powers of CMOS VLSI circuits with and without delay and its applications Science in China. Series F	2007-02-20	Paper
Fault-tolerant systems with concurrent error-locating capability Journal of Computer Science and Technology	2004-05-18	Paper
I\(_{\text{DDT}}\): Fundamentals and test generation Journal of Computer Science and Technology	2003-12-09	Paper
A novel RTL behavioral description based ATPG method Journal of Computer Science and Technology	2003-12-09	Paper
Why RTL ATPG? Journal of Computer Science and Technology	2002-08-28	Paper
Node grouping in system-level fault diagnosis Journal of Computer Science and Technology	2002-04-03	Paper
Design for delay verifiability Journal of Computer Science and Technology	1999-05-11	Paper
An analytical delay model Journal of Computer Science and Technology	1999-05-11	Paper
On concurrent multiple error diagnosability in linear analog circuits using continuous checksum	1998-03-05	Paper
Boolean process Science in China. Series E	1998-01-29	Paper
Pseudo-random test generation for large combinational circuits Journal of Computer Science and Technology	1992-09-27	Paper
Programmable logic arrays with the properties of easy test generation Science in China. Series A	1992-06-25	Paper
Aliasing errors in parallel signature analyzers Journal of Computer Science and Technology	1990-01-01	Paper
Easy test generation PLAs Journal of Computer Science and Technology	1987-01-01	Paper
scientific article; zbMATH DE number 3972795 (Why is no real title available?)	1986-01-01	Paper

Research outcomes over time

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