Yinghua Min

Available identifiers

zbMath Open min.yinghuaMaRDI QIDQ238051

List of research outcomes

Publication	Date of Publication	Type
The monotonic increasing relationship between average powers of CMOS VLSI circuits with and without delay and its applications	2007-02-20	Paper
Fault-tolerant systems with concurrent error-locating capability	2004-05-18	Paper
I\(_{\text{DDT}}\): Fundamentals and test generation	2003-12-09	Paper
A novel RTL behavioral description based ATPG method	2003-12-09	Paper
Why RTL ATPG?	2002-08-28	Paper
Node grouping in system-level fault diagnosis	2002-04-03	Paper
Design for delay verifiability	1999-05-11	Paper
An analytical delay model	1999-05-11	Paper
On concurrent multiple error diagnosability in linear analog circuits using continuous checksum	1998-03-05	Paper
Boolean process	1998-01-29	Paper
Pseudo-random test generation for large combinational circuits	1992-09-27	Paper
Programmable logic arrays with the properties of easy test generation	1992-06-25	Paper
Aliasing errors in parallel signature analyzers	1990-01-01	Paper
Easy test generation PLAs	1987-01-01	Paper
https://portal.mardi4nfdi.de/entity/Q3739059	1986-01-01	Paper

Research outcomes over time

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