Deterministic alternatives to statistical tests in binary pattern generators

MaRDI QIDQ5421173zbMATH OpenFDO

Authors Amparo Fúster-Sabater, Pino Caballero-Gil

Publication date 22 October 2007

zbMATH Keywords

balancednessbinary pattern generatornumerical examplerun distributionstatistical test

Mathematics Subject Classification ID

Random number generation in numerical analysis (65C10) Shift register sequences and sequences over finite alphabets in information and communication theory (94A55)

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Cited in

(9)

• An algorithm for development of orthogonal test sequences for binary multivariate nonlinear sequential-cellular machines
• Mathematical principles of testing discrete devices by fragment counting
• Jump and hop randomness tests for binary sequences
• A simple computational model for acceptance/rejection of binary sequence generators
• Practical design of balanced sequence LFSR-based generators
• Theoretical properties of LFSRs for built-in self test
• A multiple-sequence generator based on inverted nonlinear autonomous machines
• An effective source recognition algorithm: extraction of significant binary words
• Aspects of pseudorandomness in nonlinear generators of binary sequences.

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