Direct sampling method for anomaly imaging from scattering parameter
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Abstract: In this paper, we develop a fast imaging technique for small anomalies located in homogeneous media from S-parameter data measured at dipole antennas. Based on the representation of S-parameters when an anomaly exists, we design a direct sampling method (DSM) for imaging an anomaly and establishing a relationship between the indicator function of DSM and an infinite series of Bessel functions of integer order. Simulation results using synthetic data at f=1GHz of angular frequency are illustrated to support the identified structure of the indicator function.
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Cites work
- A direct sampling method for electrical impedance tomography
- A direct sampling method for inverse electromagnetic medium scattering
- A direct sampling method for inverse scattering using far-field data
- A direct sampling method to an inverse medium scattering problem
- A multilevel sampling method for detecting sources in a stratified ocean waveguide
- An introduction to mathematics of emerging biomedical imaging
- Characterization of the shape of a scattering obstacle using the spectral data of the far field operator
- Detection of small inhomogeneities via direct sampling method in transverse electric polarization
- Direct sampling method for diffusive optical tomography
- Enhanced Resolution in Structured Media
- Imaging schemes for perfectly conducting cracks
- MUSIC algorithm for location searching of dielectric anomalies from \(S\)-parameters using microwave imaging
- Multi-frequency subspace migration for imaging of perfectly conducting, arc-like cracks in full- and limited-view inverse scattering problems
- On the Topological Derivative in Shape Optimization
- Reconstruction of small inhomogeneities from boundary measurements
Cited in
(8)- Improvement of direct sampling method in transverse electric polarization
- Application and analysis of direct sampling method in real-world microwave imaging
- Direct sampling method for retrieving small perfectly conducting cracks
- A qualitative analysis of bifocusing method for a real-time anomaly detection in microwave imaging
- A novel time-domain direct sampling approach for inverse scattering problems in acoustics
- Direct sampling method for identifying magnetic inhomogeneities in limited-aperture inverse scattering problem
- Orthogonality sampling method for identifying small anomalies in real-world microwave imaging
- Direct sampling method for imaging small dielectric inhomogeneities: analysis and improvement
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