Discuss the structure condition and sampling condition of wavelet transform profilometry

DOI10.1080/09500340701219426MaRDI QIDQ5442877zbMATH OpenOpenAlexFDO

Authors Wenjing Chen, Juan Sun, Xianyu Su, Xintian Bian

Publication date 18 February 2008

Published in Journal of Modern Optics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/09500340701219426

zbMATH Keywords

frequency analysisfringe patternwavelet

Mathematics Subject Classification ID

Numerical methods for wavelets (65T60) Waves and radiation in optics and electromagnetic theory (78A40) Technical applications of optics and electromagnetic theory (78A55)

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